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IEC 60824:1988 IEC 60824:1988 Terminology related to microprocessors
IEC 60960:1988 IEC 60960:1988 Functional design criteria for a safety parameter display system for nuclear power stations
IEC 60510-1-5:1988 IEC 60510-1-5:1988 Methods of measurement for radio equipment used in satellite earth stations. Part 1: Measurements common to sub-systems and combinations of sub-systems. Section Five: Noise temperature measurements
IEC TR 60444-4:1988 IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60368-2-1:1988 IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
IEC 60510-3-3:1988 IEC 60510-3-3:1988 Methods of measurement for radio equipment used in satellite earth stations. Part 3: Methods of measurement on combinations of sub-systems. Section Three: Measurements for monochrome and colour television transmission
IEC 60748-20:1988 IEC 60748-20:1988 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
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