IECThere are 10390 products.

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  IEC 60824:1988

  IEC 60824:1988 IEC 60824:1988 Terminology related to microprocessors

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  IEC 60960:1988

  IEC 60960:1988 IEC 60960:1988 Functional design criteria for a safety parameter display system for nuclear power stations

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  IEC 60510-1-5:1988

  IEC 60510-1-5:1988 IEC 60510-1-5:1988 Methods of measurement for radio equipment used in satellite earth stations. Part 1: Measurements common to sub-systems and combinations of sub-systems. Section Five: Noise temperature measurements

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  IEC 60960:1988

  IEC 60960:1988 IEC 60960:1988 Functional design criteria for a safety parameter display system for nuclear power stations

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  IEC TR 60444-4:1988

  IEC TR 60444-4:1988 IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

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  IEC 60368-2-1:1988

  IEC 60368-2-1:1988 IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters

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  IEC 60510-3-3:1988

  IEC 60510-3-3:1988 IEC 60510-3-3:1988 Methods of measurement for radio equipment used in satellite earth stations. Part 3: Methods of measurement on combinations of sub-systems. Section Three: Measurements for monochrome and colour television transmission

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  IEC 60368-2-1:1988

  IEC 60368-2-1:1988 IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters

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  IEC TR 60444-4:1988

  IEC TR 60444-4:1988 IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

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  IEC 60748-20:1988

  IEC 60748-20:1988 IEC 60748-20:1988 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

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