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IEC 61883-8:2008 IEC 61883-8:2008 ...
IEC 60724:2000+- AMD1:2008 Edition 3.1 ...
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IEC 61300-3-6:2008 IEC 61300-3-6:2008 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-6: Examinations and measurements - Return loss
IEC 61676:2002/AMD1:2008 IEC 61676:2002/AMD1:2008 Amendment 1 - Medical electrical equipment - Dosimetric instruments used for non-invasive measurement of X-ray tube voltage in diagnostic radiology
IEC 61249-2-38:2008 IEC 61249-2-38:2008 Materials for printed boards and other interconnecting structures - Part 2-38: Reinforced base materials, clad and unclad - Non-halogenated epoxide woven E-glass laminate sheets of defined flammability (vertical burning test), copper-clad for lead-free assembly
IEC 61249-2-37:2008 IEC 61249-2-37:2008 Materials for printed boards and other interconnecting structures - Part 2-37: Reinforced base materials, clad and unclad - Modified non-halogenated epoxide woven E-glass laminate sheets of defined flammability (vertical burning test), copper-clad for lead-free assembly
IEC 61249-2-35:2008 IEC 61249-2-35:2008 Materials for printed boards and other interconnecting structures - Part 2-35: Reinforced base materials, clad and unclad - Modified epoxide woven E-glass laminate sheets of defined flammability (vertical burning test), copper-clad for lead-free assembly
IEC 61249-2-36:2008 IEC 61249-2-36:2008 Materials for printed boards and other interconnecting structures - Part 2-36: Reinforced base materials, clad and unclad - Epoxide woven E-glass laminate sheets of defined flammability (vertical burning test), copper-clad for lead-free assembly
IEC 61000-4-17:1999/AMD2:2008 IEC 61000-4-17:1999/AMD2:2008 Amendment 2 - Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test
IEC 62137-1-3:2008 IEC 62137-1-3:2008 Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-3: Cyclic drop test
IEC 60689:2008 IEC 60689:2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
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