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IEC 60331-1:2018 IEC 60331-1:2018 Tests for electric cables under fire conditions - Circuit integrity - Part 1: Test method for fire with shock at a temperature of at least 830 °C for cables of rated voltage up to and including 0,6/1,0 kV and with an overall diameter exceeding 20 mm
IEC 60331-2:2018 IEC 60331-2:2018 Tests for electric cables under fire conditions - Circuit integrity - Part 2: Test method for fire with shock at a temperature of at least 830 °C for cables of rated voltage up to and including 0,6/1,0 kV and with an overall diameter not exceeding 20 mm
IEC 60331-3:2018 IEC 60331-3:2018 Tests for electric cables under fire conditions - Circuit integrity - Part 3: Test method for fire with shock at a temperature of at least 830 °C for cables of rated voltage up to and including 0,6/1,0 kV tested in a metal enclosure
IEC 60331-1:2018 + Redline IEC 60331-1:2018 (Redline version) Tests for electric cables under fire conditions - Circuit integrity - Part 1: Test method for fire with shock at a temperature of at least 830°C for cables of rated voltage up to and including 0,6/1,0 kV and with an overall diameter exceeding 20 mm
IEC 60331-2:2018 + Redline IEC 60331-2:2018 (Redline version) Tests for electric cables under fire conditions - Circuit integrity - Part 2: Test method for fire with shock at a temperature of at least 830°C for cables of rated voltage up to and including 0,6/1,0 kV and with an overall diameter not exceeding 20mm
IEC 60331-3:2018 + Redline IEC 60331-3:2018 (Redline version) Tests for electric cables under fire conditions - Circuit integrity - Part 3: Test method for fire with shock at a temperature of at least 830°C for cables of rated voltage up to and including 0,6/1,0 kV tested in a metal enclosure
IEC 60191-4:2013/AMD1:2018 IEC 60191-4:2013/AMD1:2018 Amendment 1 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60191-4:2013+AMD1:2018 Edition 3.1 IEC 60191-4:2013+AMD1:2018 (Consolidated version) Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 80601-2-30:2018 IEC 80601-2-30:2018 Medical electrical equipment - Part 2-30: Particular requirements for the basic safety and essential performance of automated non-invasive sphygmomanometers
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