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Home>ASTM F1262M-14

ASTM F1262M-14

ASTM F1262M-14

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (,Metric),

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1.1 ,This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.

1.1.1 ,Discussion—,This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.

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