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1.1 ,This practice covers recommended procedures for the use of dosimeters, such as thermoluminescent dosimeters (TLD's), to determine the absorbed dose in a region of interest within an electronic device irradiated using a Co-60 source. Co-60 sources are commonly used for the absorbed dose testing of silicon electronic devices.
Note 1: ,This absorbed-dose testing is sometimes called “,total dose testing”, to distinguish it from “,dose rate testing.”, Note 2: ,The effects of ionizing radiation on some types of electronic devices may depend on both the absorbed dose and the absorbed dose rate, that is, the effects may be different if the device is irradiated to the same absorbed-dose level at different absorbed-dose rates. Absorbed-dose rate effects are not covered in this practice but should be considered in radiation hardness testing.