Cart

No products

Shipping $0.00
Total $0.00

Cart Check out

BS ISO 16413:2020

BS ISO 16413:2020

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

More details

Download

PDF AVAILABLE FORMATS IMMEDIATE DOWNLOAD
$101.44

$253.59

(price reduced by 60 %)

Contact us