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Home>ASTM F1467-18

ASTM F1467-18

ASTM F1467-18

Standard Guide for Use of an X-Ray Tester (≈,10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

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1.1 ,This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈,10 keV mean photon energy and ≈,50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.

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