1.1 ,This test method provides a procedure for measuring the electromagnetic (EM) shielding effectiveness (SE) of a planar material for a plane, far-field EM wave. From the measured data, near-field SE values can be calculated for magnetic (H) sources for electrically thin specimens.2^,3 Electric (E) field SE values are also able to be calculated from this same far-field data, but their validity and applicability have not been established.