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ASTM E3220-20

ASTM E3220-20

Standard Guide for Characterization of Graphene Flakes

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1.1 ,This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement.

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