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Home>SAE J 2052:2016-07-12

SAE J 2052:2016-07-12

SAE J 2052:2016-07-12

SAE J 2052:2016-07-12

Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

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This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

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