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    IEC 61000-4-28:- 1999/AMD2:2- 009 IEC ...>>

Home>IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 Edition 1.2

IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 Edition 1.2

IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 Edition 1.2

IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 (Consolidated version) Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques - Ripple on d.c. input power port immunity test

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Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines
- test voltage waveform,
- range of test levels,
- test generator,
- test set-up,
- test procedure.
THIS CONSOLIDATED VERSION CONSISTS OF THE FIRST EDITION (1999), ITS AMENDMENT 1 (2001) AND ITS AMENDMENT 2 (2008). THEREFORE, NO NEED TO ORDER AMENDMENTS IN ADDITION TO THIS PUBLICATION.

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