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Home>IEC 60749-32:2002/AMD1:2010

IEC 60749-32:2002/AMD1:2010

IEC 60749-32:2002/AMD1:2010

IEC 60749-32:2002/AMD1:2010 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

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