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IEC 60512-26-100:2008+AMD1:2011 Edition 1.1

IEC 60512-26-100:2008+AMD1:2011 Edition 1.1

IEC 60512-26-100:2008+AMD1:2011 (Consolidated version) Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

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IEC 60512-26-100:2008+A1:2011 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided:
- insertion loss, test 26a,
- return loss, test 26b,
- near-end crosstalk (NEXT), test 26c,
- far-end crosstalk (FEXT), test 26d,
- transfer impedance, test 26e,
- transverse conversion loss (TCL), test 26f,
- transverse conversion transfer loss (TCTL), test 26g.

This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006.

THIS CONSOLIDATED VERSION CONSISTS OF THE FIRST EDITION (2008) AND ITS AMENDMENT 1 (2011). THEREFORE, NO NEED TO ORDER AMENDMENT IN ADDITION TO THIS PUBLICATION.

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