Cart

No products

Shipping $0.00
Total $0.00

Cart Check out

Viewed products

  • ISO/DIS...

    ISO/DIS 21920-2:2020 Geometrical ...>>

  • ISO/DIS...

    ISO/DIS 17279-3:2020 Welding — Micro ...>>

IEC 60749-13:2018

IEC 60749-13:2018

IEC 60749-13:2018 Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

More details

Download

PDF AVAILABLE FORMATS IMMEDIATE DOWNLOAD
$28.40

$71.00

(price reduced by 60 %)

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Contact us